Flexible Cache Error Protection using an ECC FIFO

被引:0
|
作者
Yoon, Doe Hyun [1 ]
Erez, Mattan [1 ]
机构
[1] Univ Texas Austin, Dept Elect & Comp Engn, Austin, TX 78712 USA
关键词
soft error; error correction; last-level caches; reliability; CODES;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
We present ECC FIFO, a mechanism enabling two-tiered last-level cache error protection using an arbitrarily strong tier-2 code without increasing on-chip storage. Instead of adding redundant ECC information to each cache line, our ECC FIFO mechanism off-loads the extra information to off-chip DRAM. We augment each cache line with a tier-1 code, which provides error detection consuming limited resources. The redundancy required for strong protection is provided by a tier-2 code placed in off-chip memory. Because errors that require tier-2 correction are rare, the overhead of accessing DRAM is unimportant. We show how this method can save 15 - 25% and 10 - 17% of on-chip cache area and power respectively while minimally impacting performance, which decreases by 1% on average across a range of scientific and consumer benchmarks.
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页数:12
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