A non-contact guided wave technique for defect thinning monitoring

被引:2
|
作者
Park, Ik-Keun [1 ]
Kim, Yong-Kwon [1 ]
Kim, Tae-Hyung [1 ]
Cho, Yong-Sang [1 ]
机构
[1] Seoul Natl Univ, Dept Mech Engn, Seoul 139743, South Korea
关键词
guided wave; EMAT; defect thinning; non-contact technique;
D O I
10.4028/www.scientific.net/KEM.326-328.681
中图分类号
Q81 [生物工程学(生物技术)]; Q93 [微生物学];
学科分类号
071005 ; 0836 ; 090102 ; 100705 ;
摘要
This paper capitalizes on recent advances in the area of non-contact ultrasonic guided wave techniques. The present technique provides a decent method for nondestructive testing of defect thinning simulating a hidden corrosion or FAC(Flow Accelerated Corrosion) in a thin aluminum plate. The proposed approach is based on using EMAT(Electro-magnetic Acoustic Transducer) to generate guided waves and detect the wall thinning without any coupling. Interesting features in the dispersive behavior of selected guided modes are used for the detection of plate thinning. It is shown that mode cut-off measurement allows us to monitor a defect thinning level while a group velocity change can be used to quantify the thinning depth.
引用
收藏
页码:681 / 684
页数:4
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