High Quality Integrated Inductor in Fan-Out Wafer-Level Packaging Technology for mm-Wave Applications

被引:0
|
作者
Murugesan, Kavin Senthil [1 ]
Chernobryvko, Mykola [2 ]
Zinal, Sherko [2 ]
Rossi, Marco [2 ]
Ndip, Ivan [2 ]
Boettcher, Mathias [2 ]
Lang, Klaus Dieter [1 ]
Wieland, Marcel [3 ]
Goetze, Christian [3 ]
Bin Halim, Saquib [3 ]
Trewhella, Jean [3 ]
机构
[1] Tech Univ Berlin, Berlin, Germany
[2] Fraunhofer IZM, Berlin, Germany
[3] GLOBALFOUNDRIES, Dresden, Germany
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
EuMC06-3
引用
收藏
页数:1
相关论文
共 50 条
  • [1] High Quality Integrated Inductor in Fan-Out Wafer-Level Packaging Technology for mm-Wave Applications
    Murugesan, Kavin Senthil
    Chernobryvko, Mykola
    Zinal, Sherko
    Rossi, Marco
    Ndip, Ivan
    Boettcher, Mathias
    Lang, Klaus Dieter
    Wieland, Marcel
    Goetze, Christian
    Bin Halim, Saquib
    Trewhella, Jean
    2020 50TH EUROPEAN MICROWAVE CONFERENCE (EUMC), 2020,
  • [2] High Quality Integrated Inductor in Fan-out Wafer-Level Packaging Technology for mm-Wave Applications
    Murugesan, Kavin Senthil
    Chernobryvko, Mykola
    Zinal, Sherko
    Rossi, Marco
    Ndip, Ivan
    Boettcher, Mathias
    Lang, Klaus Dieter
    Wieland, Marcel
    Goetze, Christian
    Bin Halim, Saquib
    Trewhella, Jean
    2020 50TH EUROPEAN MICROWAVE CONFERENCE (EUMC), 2020, : 89 - 92
  • [3] Fan-out Wafer Level Packaging for 5G and mm-Wave Applications
    Braun, T.
    Becker, K-F
    Hoelck, O.
    Kahle, R.
    Woehrmann, M.
    Toepper, M.
    Ndip, I
    Maass, U.
    Tschoban, C.
    Aschenbrenner, R.
    Voges, S.
    Lang, K-D
    2018 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING AND IMAPS ALL ASIA CONFERENCE (ICEP-IAAC), 2018, : 247 - 251
  • [4] Design and Measurement of Interconnects in Fan-Out Wafer-Level Packaging (FOWLP) for mm-Wave Applications up to 100 GHz
    Zinal, Sherko
    Murugesan, Kavin S.
    Rossi, Marco
    Boettcher, Matthias
    Ndip, Ivan
    Lang, Klaus-Dieter
    Wieland, Marcel
    Goetze, Christian
    Bin Halin, Saquib
    Trewhella, Jean
    2021 51ST EUROPEAN MICROWAVE CONFERENCE (EUMC), 2021, : 2 - 5
  • [5] Integration of mm-wave Antennas on Fan-Out Wafer Level Packaging (FOWLP) for Automotive Radar Applications
    Chen, Zihao
    Zhu, Xi
    Xu, Leijia
    PROCEEDINGS OF THE 2019 IEEE ASIA-PACIFIC MICROWAVE CONFERENCE (APMC), 2019, : 1607 - 1609
  • [6] Fan-Out Wafer-Level Packaging for Heterogeneous Integration
    Lau, John
    Li, Ming
    Li, Margie
    Chen, Tony
    Xu, Iris
    Yong, Qing Xiang
    Cheng, Zhong
    Fan, Nelson
    Kuah, Eric
    Li, Zhang
    Tan, Kim Hwee
    Cheung, Y. M.
    Ng, Eric
    Lo, Penny
    Kai, Wu
    Hao, Ji
    Wee, Koh Sau
    Ran, Jiang
    Xi, Cao
    Beica, Rozalia
    Lim, Sze Pei
    Lee, N. C.
    Ko, Cheng-Ta
    Yang, Henry
    Chen, Y. H.
    Tao, Mian
    Lo, Jeffery
    Lee, Ricky
    2018 IEEE 68TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2018), 2018, : 2360 - 2366
  • [7] Fan-Out Wafer-Level Packaging for Heterogeneous Integration
    Lau, John H.
    Li, Ming
    Qingqian, Margie Li
    Chen, Tony
    Xu, Iris
    Yong, Qing Xiang
    Cheng, Zhong
    Fan, Nelson
    Kuah, Eric
    Li, Zhang
    Tan, Kim Hwee
    Cheung, Yiu-Ming
    Ng, Eric
    Lo, Penny
    Kai, Wu
    Hao, Ji
    Wee, Koh Sau
    Ran, Jiang
    Xi, Cao
    Beica, Rozalia
    Lim, Sze Pei
    Lee, N. C.
    Ko, Cheng-Ta
    Yang, Henry
    Chen, Yu-Hua
    Tao, Mian
    Lo, Jeffery
    Lee, Ricky S. W.
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2018, 8 (09): : 1544 - 1560
  • [8] Warpage Characterization of Molded Wafer for Fan-Out Wafer-Level Packaging
    Cheng, Hsien-Chie
    Liu, Yan-Cheng
    JOURNAL OF ELECTRONIC PACKAGING, 2020, 142 (01)
  • [9] A Fan-Out Wafer-Level Package Technology for Millimeter-Wave Monolithic Integrated Circuits
    Wu, Xiao-Feng
    Chen-Hui-Xia
    Yin, Yu-Hang
    Xu, Zong-Rui
    Wu, Lin-Sheng
    Mao, Jun-Fa
    2024 INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY, ICMMT, 2024,
  • [10] Warpage and Thermal Characterization of Fan-out Wafer-Level Packaging
    Lau, John
    Li, Ming
    Tian, DeWen
    Fan, Nelson
    Kuah, Eric
    Kai, Wu
    Li, Margie
    Hao, JiYuen
    Cheung, Ken
    Li, Zhang
    Tan, Kim Hwee
    Beica, Rozalia
    Ko, Cheng-Ta
    Chen, Yu-Hua
    Lim, Sze Pei
    Lee, Ning Cheng
    Wee, Koh Sau
    Ran, Jiang
    Xi, Cao
    2017 IEEE 67TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2017), 2017, : 595 - 602