Efficient Phase Unwrapping Algorithm Based on Fringe Projection Applying Reliability-guided Technique

被引：0
|
作者：
Li, Wenguo [1 ]
Duan, Shaojun [2 ]
机构：
[1] Kunming Univ Sci & Technol, Fac Mech & Elect Engn, 68 Wenchang Rd,121 St, Kunming 650093, Peoples R China
[2] Kunming Univ, Kunming Econ & Technol Dev Zone, Kunming 650214, Peoples R China
来源：
NANOTECHNOLOGY AND PRECISION ENGINEERING, PTS 1 AND 2 | 2013年 / 662卷
关键词：
phase unwrapping; optical measurement; fringe projection; reliability-guided; path reliability;
D O I：
10.4028/www.scientific.net/AMR.662.975
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
We present a new method to define the reliability of pixel and path of phase unwrapping. The reliability function is calculated based on modulation, second difference of wrapped phase, and second diffemce of modulation, and then we present the concept of smoothness of path, the reliability of path is calculated based on reliability of pixel and smoothness of path. Experiment results validate the correctness of our proposed algorithm.
引用
收藏
页码：975 / +
页数：2
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