Measurement of Electromagnetic Characteristics Materials in a Rectangular Waveguide

被引：0
|
作者：
Evseev, V., I [1 ]
Lupanova, E. A. [2 ]
Nikulin, S. M. [2 ]
Petrov, V. V. [2 ]
机构：
[1] LLC Arzamas Instrument Making Design Bur, Moscow, Russia
[2] Nizhniy Novgorod State Tech Univ, Nizhnii Novgorod, Russia
来源：
2019 PHOTONICS & ELECTROMAGNETICS RESEARCH SYMPOSIUM - SPRING (PIERS-SPRING) | 2019年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A waveguide method for measuring the relative complex dielectric constant of flat samples of insulating materials that is invariant to the position of the sample over a waveguide section is discussed. The exclusion of the effect of coaxial-waveguide transitions on the measurement results is performed by the LR method. The measured parameters are determined in the frequency range by minimizing the objective function.
引用
收藏
页码：2088 / 2092
页数：5
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