Tunneling magnetoresistance of double-barrier magnetic tunnel junctions in sequential and coherent regimes

被引:11
|
作者
Niu, ZP [1 ]
Feng, ZB
Yang, J
Xing, DY
机构
[1] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
[2] Nanjing Univ, Dept Phys, Nanjing 210093, Peoples R China
[3] PAL Univ Sci & Technol, Inst Sci, Nanjing 210007, Peoples R China
关键词
D O I
10.1103/PhysRevB.73.014432
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Taking into account the transport with coherent and sequential components, we study the conductance and tunneling magnetoresistance (TMR) in double F/I/F/I/F tunnel junctions with F the ferromagnet and I the thin insulating layer. It is found that the TMR ratio for the F/I/F/I/F junction in the sequential regime cannot go beyond the larger one between the TMR ratios of the two single F/I/F junctions forming the double junction. The coherent transport of electrons results in oscillations of the tunneling conductance and TMR with thickness L of the middle F layer, the sequential component leading to a decay of the oscillation amplitude with L.
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页数:6
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