Fast Fault Detection of Open Power Switch in Cascaded H-Bridge Multilevel Inverters

被引：0
|
作者：
Mukherjee, Suvajit [1 ]
Zagrodnik, Michael Adam [1 ]
Wang, Peng [1 ]
机构：
[1] Nanyang Technol Univ, Rolls Royce NTU Corp Lab, Singapore, Singapore
来源：
2016 IEEE TRANSPORTATION ELECTRIFICATION CONFERENCE AND EXPO (ITEC) | 2016年
基金：
新加坡国家研究基金会;
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The Cascaded H-Bridge topology has in recent years become popular for use in medium voltage drives. The reliability of this topology however is of concern due to the large number of semiconductor switches. The natural redundancy possessed by the CHB topology can only be realized if failed devices may be identified and removed from the system. In this paper a fault diagnostic method for open switch fault is proposed. The method is based on the prediction of the active and zero voltage states of each module. With the proposed method, the exact location of the switch under fault in an H-bridge module can be determined quickly. The performance of the proposed technique has been verified through simulation.
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页数：5
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