Position-resolved timing characterisation tests of hexagonal and trench 3D silicon detectors

被引：0

作者：

Addison, Matthew ^{[1
]}

Da Via, Cinzia ^{[1
]}

Lai, Adriano ^{[2
]}

Dalla Betta, Gian-Franco ^{[3
]}

Garau, Michela ^{[2
]}

Lampis, Andrea ^{[2
]}

Aresti, Mauro ^{[2
]}

Cardini, Alessandro ^{[2
]}

Cossu, Gian-Matteo ^{[2
]}

Loi, Angelo ^{[2
]}

机构：

[1] Univ Manchester, Phys & Astron, Manchester, England

[2] INFN, Cagliari, Italy

[3] Univ Trento, Trento, Italy

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2023年 / 1054卷

关键词：

3D silicon; Timing characterisation;

D O I：

10.1016/j.nima.2023.168392

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Position-resolved timing characterisation tests were performed on individual pixels of hexagonal and trench 3D silicon sensors. An IR laser was used to deposit energy equivalent to 1 MIP with a 1 & mu;m spatial resolution onto each sensor, which were attached to custom-designed fast read-out electronics chips. Time of Arrival (ToA) values obtained were (544 & PLUSMN; 29.8) ps for the hexagonal geometry, and (515 & PLUSMN; 8.2) ps for the trench geometry.

引用

页数：3

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