Diffused trenches for high fill-factor Low-Gain Avalanche Diodes

被引:0
|
作者
Giacomini, Gabriele [1 ]
Platte, Christopher W. [2 ,3 ]
机构
[1] Brookhaven Natl Lab, Instrumentat Div, Upton, NY 11973 USA
[2] Univ Michigan, Dept Phys, Ann Arbor, MI USA
[3] Vanderbilt Univ, Dept Phys & Astron, Nashville, TN USA
关键词
Low-Gain Avalanche Diodes; LGAD; Avalanche Diodes; APD; Trench; Silicon sensors; Fill-factor; TCAD simulations; Timing; DETECTORS LGAD; FABRICATION; TECHNOLOGY;
D O I
10.1016/j.nima.2023.168497
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Low-Gain Avalanche Diodes (LGADs) are a class of silicon detectors that have been specifically designed for the fast detection of minimum ionizing particles (mips) in High-Energy Physics experiments. While they provide timing resolution on the order of a few tens of picoseconds, they cannot achieve high spatial resolution due to the intrinsic characteristics of their structures. Thus, active R & D is on-going to develop detectors based on LGADs to improve their spatial resolution while maintaining the timing performance of the LGADs. Such devices are, for example, AC-coupled LGADs and Deep-Junction LGADs. Another device option is the Trench Isolated LGAD (TI LGAD), where trenches etched at the periphery of the pixels isolate them while providing a high fill-factor. In this paper we present a variation of this latter approach, demonstrating its feasibility by means of 2-dimensional TCAD simulations.
引用
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页数:8
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