Atomic Force Microscopy and the Building Particle in the Fluctuation Theory of Crystal Growth

The specific features of application of a low-energy atomic-force microscope (AFM) for studying the dynamic process of face growth in terms of the fluctuation model of crystal growth are discussed. It is shown that the probe interaction with an area of growing crystal surface on the time scale characteristic of a sequence of free energy fluctuations is a limiting factor for constructing an image of growing face surface. Agreement between the phenomenological and quantum (according to the uncertainty relation) descriptions of the effect of limiting magnification for a growing crystal face in an AFM is demonstrated. Specific features of detecting a growth stage on a crystal face using a transmission/scanning high-resolution electron microscope in a gas medium are also discussed. The effect of ultimate magnification when observing crystal growth in an AF\M is a basis for discussing the concept of the transient state of matter in the topochemical reaction of crystal growth and the phenomenon of building particle.