Infrared photocurrent imaging and spectroscopy with an atomic-force-microscopy probe

被引：0

作者：

Venanzi, T. ^{[1
]}

Giliberti, V. ^{[1
]}

Temperini, M. E. ^{[2
]}

Sotgiu, S. ^{[2
]}

Polito, R. ^{[2
]}

Mattioli, F. ^{[3
]}

Coletti, C. ^{[4
,5
]}

Roddaro, S. ^{[6
]}

Baldassarre, L. ^{[2
]}

Ortolani, M. ^{[2
]}

机构：

[1] Italian Inst Technol IIT, Ctr Life NanoSci, I-00161 Rome, Italy

[2] Sapienza Univ Rome, Dept Phys, I-00185 Rome, Italy

[3] CNR IFN, Inst Photon & Nanotechnol, I-00156 Rome, Italy

[4] Italian Inst Technol IIT, I-56126 Pisa, Italy

[5] NEST, I-56126 Pisa, Italy

[6] Univ Pisa, Dept Phys, I-56127 Pisa, Italy

来源：

2023 48TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES, IRMMW-THZ | 2023年

关键词：

D O I：

10.1109/IRMMW-THz57677.2023.10299344

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We demonstrate a new setup where the photocurrent excited in graphene by mid-infrared quantum cascade laser pulses is collected with an atomic force microscopy probe (PC-AFM). The setup can measure the infrared photoresponse of devices with nanometric spatial resolution, but it can also be used as a novel infrared nanospectroscopy technique.

引用

页数：2

共 50 条

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