Fault Diagnosis of Support Vector Machine Analog Circuits Based on Improved Particle Swarm Optimization

被引:0
|
作者
Yang, Junping [1 ]
Song, Qinghua [1 ]
机构
[1] Anyang Inst Technol, Sch Elect Informat & Elect Engn, Anyang 455000, Henan, Peoples R China
关键词
IPSO; SVM; Analog Circuit; Fault Diagnosis; Learning Factor; Inertia Weight; Signal Characteristics;
D O I
10.1166/jno.2023.3417
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The development of electronic circuits requires that the reliability and security of circuit equipment and system operation are also increasing. In addition, due to the complexity of the operating environment, it is very important to strengthen the fault diagnosis and real-time testing technology of analog circuits in circuit systems. Based on this, this paper studied the fault diagnosis of analog circuits with Support Vector Machine (SVM), and introduced Improved Particle Swarm Optimization (IPSO) algorithm to optimize the parameters of SVM. In other words, the dynamic weight setting and factor improvement of Particle Swarm Optimization (PSO) algorithm aim to accelerate algorithm performance improvement, and information extraction and diagnosis model construction are carried out on the basis of considering circuit fault characteristics. Through the performance test and application analysis of the improved algorithm proposed in the study, the error value of the improved algorithm was basically stable at 0.0103 in the late stage of classification training, and its prediction accuracy rate was more than 8%, and the classification consumption time was less. At the same IP 203 8 109 10 On: Sun 01 Oct 2023 06:55:54 time, the accuracy of fault featureextraction results itraining and tet scenarios was above 94%, and the Copyright: American Scientif c Publishers search performance was obviously better than othr comparison algorithms, which effectively improved the De ivered by Ingenta fault diagnosis accuracy and efficiency. The IPSO algorithm model can effectively identify analog circuit fault information, and shows good information optimization performance. It has certain validity and rationality in circuit fault diagnosis and security assurance.
引用
收藏
页码:743 / 752
页数:10
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