The Effect of Geometric and Material Uncertainty on Debonding Warpage in Fan-Out Panel Level Packaging

被引:1
|
作者
Chen, H. L. [1 ]
Chiang, K. N. [2 ]
机构
[1] Natl Tsing Hua Univ, Adv Microsyst Packaging & Nanomech Res Lab, Hsinchu 300, Taiwan
[2] Natl Tsing Hua Univ, Dept Power Mech Engn, Hsinchu 300, Taiwan
关键词
EXPERIMENTAL-VERIFICATION; SIMULATION;
D O I
10.1109/EuroSimE56861.2023.10100786
中图分类号
O414.1 [热力学];
学科分类号
摘要
With the advantages of high-use efficiency and low production cost, Fan-Out Panel Level Packaging (FOPLP) has become a high-profile advanced packaging technology in the market. However, in FOPLP, processes such as Compression molding, Post Mold Cure (PMC), and Debonding process are performed sequentially. These processes will cause the temperature of the inner package to rise and fall repeatedly, resulting in warpage. There are two main reasons for warpage: Coefficient of Thermal Expansion (CTE) mismatch between the two different materials, and the curing shrinkage of the thermosetting material Epoxy Molding Compound ( EMC) due to heat. Since excessive warpage leads to yield and reliability issues, this study will use the Finite Element Method (FEM) to investigate the warpage of the PLP process and apply Process Modeling Technology during simulation. Furthermore, extensive literature results show that the warpage of FOPLP tends to be asymmetric. This phenomenon is primarily due to the inconsistency in thickness and material properties caused by machine tilt, shrinkage of the epoxy, etc., which will also be discussed in this study. The simulation results show that geometric and material uncertainty will directly cause the asymmetric after the debonding process, in addition, the release path of debonding also plays a significant role in the pattern of the warpage.
引用
下载
收藏
页数:6
相关论文
共 50 条
  • [1] Study of the influence of material properties and geometric parameters on warpage for Fan-Out Wafer Level Packaging
    Salahouelhadj, A.
    Gonzalez, M.
    Podpod, A.
    Rebibis, K.
    Beyne, E.
    2018 7TH ELECTRONIC SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE (ESTC), 2018,
  • [2] Warpage Management for Fan-Out Packaging Moving from Wafer Level to Panel Level
    Lu, Mei-Chien
    PROCEEDINGS OF THE 17TH IEEE INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS (ITHERM 2018), 2018, : 360 - 367
  • [3] A Quantitative Model to Understand the Effect of Gravity on the Warpage of Fan-Out Panel-Level Packaging
    Yang, Guannan
    Kuang, Ziliang
    Lai, Haiqi
    Liu, Yu
    Cui, Ruibin
    Cao, Jun
    Zhang, Yu
    Cui, Chengqiang
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2021, 11 (11): : 2022 - 2030
  • [4] From Fan-out Wafer to Fan-out Panel Level Packaging
    Braun, T.
    Becker, K. -F.
    Raatz, S.
    Bader, V.
    Bauer, J.
    Aschenbrenner, R.
    Voges, S.
    Thomas, T.
    Kahle, R.
    Lang, K. -D.
    2015 EUROPEAN CONFERENCE ON CIRCUIT THEORY AND DESIGN (ECCTD), 2015, : 29 - 32
  • [5] Panel Warpage and Die Shift Simulation and Characterization of Fan-Out Panel-Level Packaging
    Che, F. X.
    Yamamoto, K.
    Rao, Vempati Srinivasa
    2020 IEEE 70TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2020), 2020, : 2097 - 2104
  • [6] Warpage Analysis with Newly Molding Material of Fan-Out Panel Level Packaging and the Board Level Reliability Test Results
    Kikuchi, Kazuhiro
    Nedzu, Yuusuke
    Sugino, Takashi
    2018 IEEE 68TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2018), 2018, : 973 - 978
  • [7] Warpage Analysis and Optimization of Fan-Out Panel-Level Packaging in Hygrothermal Environment
    Wang, Zijian
    Yang, Wen
    Zhu, Cheng
    Wu, Shangxian
    Ni, Yan
    Yang, Daoguo
    2023 24TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT, 2023,
  • [8] Warpage Analysis of Fan-Out Panel-Level Packaging Using Equivalent CTE
    Tsai, C. H.
    Liu, S. W.
    Chiang, K. N.
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2020, 20 (01) : 51 - 57
  • [9] Process Dependent Material Characterization for Warpage Control of Fan-Out Wafer Level Packaging
    Wittler, Olaf
    van Dijk, Marius
    Huber, Saskia
    Walter, Hans
    Schneider-Ramelow, Martin
    IEEE 71ST ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2021), 2021, : 2165 - 2170
  • [10] Panel Warpage of Fan-Out Panel-Level Packaging Using RDL-First Technology
    Che, Fa Xing
    Yamamoto, Kazunori
    Rao, Vempati Srinivasa
    Sekhar, Vasarla Nagendra
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2020, 10 (02): : 304 - 313