Ultrahigh responsivity of non-van der Waals Bi2O2Se photodetector

被引:2
|
作者
Lakhchaura, Suraj [1 ]
Gokul, M. A. [1 ]
Rahman, Atikur [1 ]
机构
[1] Indian Inst Sci Educ & Res IISER, Dept Phys, Pune 411008, Maharashtra, India
关键词
Bi2O2Se; Photoresponsivity; APCVD; FET; TEMPERATURE; MOBILITY; RAMAN;
D O I
10.1088/1361-6528/ad0bd3
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Bismuth oxyselenide has recently gained tremendous attention as a promising 2D material for next-generation electronic and optoelectronic devices due to its ultrahigh mobility, moderate bandgap, exceptional environmental stability, and presence of high-dielectric constant native oxide. In this study, we have synthesized single-crystalline nanosheets of Bismuth oxyselenide with thicknesses measuring below ten nanometers on Fluorophlogopite mica using an atmospheric pressure chemical vapor deposition system. We transferred as-grown samples to different substrates using a non-corrosive nail polish-assisted dry transfer method. Back-gated Bi2O2Se field effect transistors showed decent field effect mobility of 100 cm(2) V(-1)s(-1). The optoelectronic property study revealed an ultrahigh responsivity of 1.16 <bold>x</bold> 10(6) A W-1 and a specific detectivity of 2.55 <bold>x</bold> 10(13) Jones. The samples also exhibited broadband photoresponse and gate-tunable photoresponse time. These results suggest that Bi2O2Se is an excellent candidate for future high-performance optoelectronic device applications.
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页数:8
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