Prediction Model for Electrographic Status Epilepticus in Critically Ill Children

被引：0
|
作者：
Fung, F.
Parikh, D.
Jacobwitz, M.
Topjian, A.
Abend, N.
机构：
来源：
ANNALS OF NEUROLOGY | 2023年 / 94卷
关键词：
Epilepsy;
D O I：
暂无
中图分类号：
R74 [神经病学与精神病学];
学科分类号：
摘要：
61
引用
收藏
页码：S55 / S56
页数：2
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