Design for EMI/ESD Immunity for Flexible and Wearable Electronics

被引：2
|
作者：
Pan, Zijin [1 ]
Li, Xunyu [1 ]
Hao, Weiquan [1 ]
Miao, Runyu [1 ]
Wang, Albert [1 ]
机构：
[1] Univ Calif Riverside, Dept Elect & Comp Engn, Riverside, CA 92521 USA
来源：
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | 2023年 / 11卷
关键词：
Electrostatic discharges; Electromagnetic interference; Wearable computers; Immunity testing; Integrated circuits; Immune system; Biomedical monitoring; EMI; ESD; EMC; flexible; wearable; design-for-reliability; immunity; WDUT;
D O I：
10.1109/JEDS.2023.3250356
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Proliferation of flexible, wearable and portable electronics come with new challenges of system reliability. Particularly, flexible and wearable electronics cause more frequent and are more susceptible to electromagnetic interference (EMI) effects and electrostatic discharge (ESD) failures, and have unique requirements for design-for-reliability (DfR) associated with EMI and ESD immunity to achieve electromagnetic compatibility (EMC) compliance. This paper outlines the key challenges in design for EMI and ESD immunity for wearable microsystems and discusses potential design for EMI/ESD immunity solutions.
引用
收藏
页码：700 / 707
页数：8
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