Temperature-resilient random number generation with stochastic actuated magnetic tunnel junction devices

Nanoscale magnetic tunnel junction (MTJ) devices can efficiently convert thermal energy in the environment into random bitstreams for computational modeling and cryptography. We recently showed that perpendicular MTJs actuated by nanosecond pulses can generate true random numbers at high data rates. Here, we explore the dependence of probability bias-the deviations from equal probability (50/50) 0/1 bit outcomes-of such devices on temperature, pulse amplitude, and duration. Our experimental results and device model demonstrate that operation with nanosecond pulses in the ballistic limit minimizes variation of probability bias with temperature to be far lower than that of devices operated with longer-duration pulses. Furthermore, operation in the short-pulse limit reduces the bias variation with pulse amplitude while rendering the device more sensitive to pulse duration. These results are significant for designing true random number generator MTJ circuits and establishing operating conditions.