Sensitivity analysis of multipactor susceptibility zone to variations in secondary electron yield values

We present a sensitivity analysis of the multipactor susceptibility zones to variations in the secondary electron yield (SEY) of materials, specifically focusing on the first and second unity crossover points of SEYs. In conducting this research, we leveraged our semi-analytic approach, which allows for the rapid prediction of the full multipactor zones with enhanced accuracy. Using this approach, we unveil several unique features of multipactor susceptibility zones, including the infinite extension of different-order multipactor zones and the overlap between them. Building upon this prediction capability, our results complement previous findings on the same topic and reveal that the multipactor zones depend not only on the first crossover point but also on the second crossover point of SEY, which this latter predominantly impacts multipactor susceptibility zones for low SEY materials. To validate our predictions, we present two distinct sets of multipactor experiments, providing empirical support for our results.