Direct Assessment of Auger Recombination Rates of Charged Excitons via Opto-Electrical Measurements

Auger recombination (AR), whereby the electron-hole recombination energy is transferred to a third charge carrier, prevails in nanocrystal quantum dots (QDs) and governs the performance of QD-based devices including light-emitting diodes and lasers. Thus, precise AR evaluation of QDs is essential for understanding and improving the characteristics of such applications. So far, conventional charging approaches, such as the stir-versus-static method, photochemistry, or electrochemistry, have been able to assess the AR decay rate of either positively (two holes and one electron, X+) or negatively (one hole and two electrons, X-) charged excitons, and the decay dynamics of the other type of charged exciton is presumably estimated by the superposition principle of the biexciton Auger process. Herein, we demonstrate an opto-electrical method that enables us to precisely assess AR rates of X+ and X- in core/shell heterostructured QDs. Specifically, we devise electron-only devices and hole-only devices to inject extra charge carriers into QDs without unwanted side reactions or degradation of QDs and probe AR characteristics of these charged QDs via time-resolved photoluminescence measurements. We find that AR rates of charged excitons, both X+ and X-, gained from the present method agree well with those attained from conventional approaches and the superposition principle, corroborating the validity of the present approach. This present method permits us to comprehend multicarrier dynamics in QDs, prompting the use of QDs in light-emitting diodes and laser devices based on QDs.