Automated Grain Boundary Detection for Bright-Field Transmission Electron Microscopy Images via U-Net

被引：0
|
作者：
Patrick, Matthew J.
Eckstein, James K.
Lopez, Javier R.
Toderas, Silvia
Asher, Sarah A.
Whang, Sylvia, I
Levine, Stacey
Rickman, Jeffrey M.
Barmak, Katayun
机构：
来源：
MICROSCOPY AND MICROANALYSIS | 2023年 / 30卷 / 03期
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D O I：
10.1093/micmic/ozad140
中图分类号：
T [工业技术];
学科分类号：
08 ;
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页码：632 / 632
页数：1
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