LPV Model-Based Fault Detection and Isolation in DC Microgrids Through Signature Recognition

被引:4
|
作者
Wang, Ting [1 ]
Liang, Liliuyuan [2 ]
Hao, Zhiguo [3 ]
Monti, Antonello [4 ]
Ponci, Ferdinanda [4 ]
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
[2] Contemporary Amperex Technol Co Ltd, New Energy Storage Syst Dept, Ningde 352100, Peoples R China
[3] Xi An Jiao Tong Univ, Sch Elect Engn, Xian 710049, Peoples R China
[4] Rhein Westfal TH Aachen, Inst Automat Complex Power Syst, E ON Energy Res Ctr, D-52074 Aachen, Germany
基金
中国国家自然科学基金;
关键词
DC microgrids; fault detection; linear parameter varying models; signature recognition; unknown input observers; LITHIUM-ION; DIAGNOSIS; BATTERY; PROTECTION; SCHEME; IDENTIFICATION; TRANSFORM;
D O I
10.1109/TSG.2022.3230725
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The safety of DC microgrids is threatened by multiple types of faults occurring in different components, entailing multi-target fault detection and isolation solutions. To address this issue, this paper introduces a comprehensive fault detection and isolation framework based on the mathematical models of DC microgrids. In this work, the DC microgrids with non-linear characteristics are modeled via polytopic linear parameter varying modeling, which has the remarkable property to adapt to changing operating points. On this basis, a bank of unknown input observers are built. At last, settingless fault classification is achieved through reconstructing the patterns in the outputs of the observers. Compared with existing fault detection and isolation methods for DC microgrids, the proposed system-level solution can simultaneously diagnose multiple faults in DC microgrids in non-stationary operating states. Moreover, the proposed signature recognition scheme solves the difficulty in threshold setting and greatly improves the tolerance of the proposed method to modeling and measurement uncertainties. The accuracy, adaptivity and robustness of this method are verified through extensive numerical tests with MATLAB/Simulink.
引用
收藏
页码:2558 / 2571
页数:14
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