Modeling the Role of Testing Coverage in the Software Reliability Assessment

被引:2
|
作者
Kumar, Sudeep [1 ]
Aggarwal, Anu G. [2 ]
Gupta, Ritu [1 ]
机构
[1] Amity Univ, Dept Math, AIAS, Noida 201303, Uttar Pradesh, India
[2] Univ Delhi, Dept Operat Res, Delhi, India
关键词
-Testing Coverage; Software reliability growth models; Non-homogeneous poisson process; Software reliability; Release planning; testing effort; GROWTH;
D O I
10.33889/IJMEMS.2023.8.3.028
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
To assure the reliability and quality of the final product, testing is an essential and crucial part in the software development cycle. During this process, fault correction/detection activities are carried out to increase the reliability of the software. The non -homogeneous Poisson Process (NHPP) is the basis of the investigated software reliability growth models (SRGMs), which are based on the supposition that the number of faults found is affected by the amount of code covered during testing and that the amount of code covered during testing depends on the testing effort expended. This research takes into consideration several testing coverage functions: exponential, delayed S-shaped and logistic distributions, to propose three SRGMs that are based on testing efforts. For testing effort expenditure Weibull distribution has been employed. Two real failure datasets have been utilised to validate the proposed models, and their performance is evaluated using four goodness-of-fit metrics, including predictive ratio risk (PRR), coefficient of determination (R2), predictive power (PP) and mean square error (MSE). Sensitivity analysis of cost requirement-based release time of software for exponential function has been done by using a genetic algorithm, which minimized the overall cost of the software subject to the requirement for reliability.
引用
收藏
页码:504 / 513
页数:10
相关论文
共 50 条
  • [1] Modeling and Analysis of Reliability and Optimal Release Policy of Software with Testing Domain Coverage Efficiency
    Chatterjee, S.
    Chaudhuri, Bhagyashree
    Bhar, Chandan
    Shukla, Ankur
    2016 5TH INTERNATIONAL CONFERENCE ON RELIABILITY, INFOCOM TECHNOLOGIES AND OPTIMIZATION (TRENDS AND FUTURE DIRECTIONS) (ICRITO), 2016, : 90 - 95
  • [2] Testing coverage based NHPP software reliability growth modeling with testing effort and change-point
    Aggarwal, Anu
    Kumar, Sudeep
    Gupta, Ritu
    INTERNATIONAL JOURNAL OF SYSTEM ASSURANCE ENGINEERING AND MANAGEMENT, 2024, : 5157 - 5166
  • [3] Software Reliability Virtual Testing for Reliability Assessment
    Ai, Jun
    Pei, Hanyu
    Yan, Liang
    2014 IEEE EIGHTH INTERNATIONAL CONFERENCE ON SOFTWARE SECURITY AND RELIABILITY - COMPANION (SERE-C 2014), 2014, : 71 - 77
  • [4] Testing coverage based software reliability assessment incorporating effort expenditure and error generation
    Kumar, Sudeep
    Aggarwal, Anu G.
    Gupta, Ritu
    OPSEARCH, 2023, 60 (04) : 1888 - 1901
  • [5] Testing coverage based software reliability assessment incorporating effort expenditure and error generation
    Sudeep Kumar
    Anu G. Aggarwal
    Ritu Gupta
    OPSEARCH, 2023, 60 : 1888 - 1901
  • [6] MODELING SOFTWARE TESTING FOR RELIABILITY PREDICTION
    DOWNS, T
    COMPUTER SYSTEMS SCIENCE AND ENGINEERING, 1994, 9 (02): : 104 - 111
  • [7] NHPP software reliability and cost models with testing coverage
    Pham, H
    Zhang, XM
    EUROPEAN JOURNAL OF OPERATIONAL RESEARCH, 2003, 145 (02) : 443 - 454
  • [8] Software reliability model considering both testing effort and testing coverage
    Li, Hai-Feng
    Wang, Shuan-Qi
    Liu, Chang
    Zheng, Jun
    Li, Zhen
    Ruan Jian Xue Bao/Journal of Software, 2013, 24 (04): : 749 - 760
  • [9] Software Reliability Modelling Considering both Testing Effort and Testing Coverage
    Liu Chang
    Liu Yuan
    Ren Zhanyong
    Li Haifeng
    PROCEEDINGS OF THE 2015 INTERNATIONAL SYMPOSIUM ON COMPUTERS & INFORMATICS, 2015, 13 : 130 - 135
  • [10] Software Reliability Assessment: Modeling and Algorithms
    Nagaraju, Vidhyashree
    2018 29TH IEEE INTERNATIONAL SYMPOSIUM ON SOFTWARE RELIABILITY ENGINEERING WORKSHOPS (ISSREW), 2018, : 166 - 169