Development of a Collective Thomson Scattering diagnostic system on SNU X-pinch device

被引：0
|
作者：
Lee, Jongmin [1 ]
Kim, Jung-Hwa [1 ]
Park, Sungbin [1 ]
You, Yong Sung [2 ]
Lee, Jae-seok [2 ]
Ghim, Y. -c. [2 ]
Hwang, Y. S. [1 ]
机构：
[1] Seoul Natl Univ, Dept Nucl Engn, Seoul 08826, South Korea
[2] Korea Adv Inst Sci & Technol, Dept Nucl & Quantum Engn, Daejeon 34141, South Korea
来源：
JOURNAL OF INSTRUMENTATION | 2023年 / 18卷 / 12期
关键词：
Plasma diagnostics-interferometry; spectroscopy and imaging; Plasma diagnostics probes;
D O I：
10.1088/1748-0221/18/12/C12004
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The Collective Thomson Scattering (CTS) diagnostic system has been developed for the X-pinch device at Seoul National University. The system is designed to measure various parameters of plasma jets, including plasma temperature and plasma flow velocity. For the flow velocity measurement, the second harmonic Nd:YAG laser and the collection optics are oriented in order to ensure the scattering vector is aligned with the flow direction. The collection optics have been optimized to maximize photon efficiency. Due to the requirement of high spectral dispersion and resolution for the diagnosis of CTS spectra, the spectrometer is designed with a dispersion of 0.004 nm/pixel. The spectral dispersion and resolution of the system has been measured. The CTS diagnostic system will contribute to a deeper understanding of X-pinch plasma dynamics and the development of advanced High Energy Density Plasma (HEDP)-based technologies.
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页数：10
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