Analyzing Fundamental Properties of Two-Dimensional Materials by Raman Spectroscopy from Microscale to Nanoscale

被引:3
|
作者
Wu, Heng [1 ,2 ,3 ]
Lin, Miao-Ling [1 ]
Zhou, Yan [1 ]
Zhang, Xin [1 ]
Tan, Ping-Heng [1 ,2 ,3 ]
机构
[1] Chinese Acad Sci, Inst Semicond, State Key Lab Superlatt & Microstruct, Beijing 100083, Peoples R China
[2] Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China
[3] Univ Chinese Acad Sci, CAS Ctr Excellence Topol Quantum Computat, Beijing 100049, Peoples R China
基金
中国国家自然科学基金;
关键词
DER-WAALS HETEROSTRUCTURES; TRANSITION-METAL DICHALCOGENIDES; STRUCTURAL PHASE-TRANSITION; TWISTED MULTILAYER GRAPHENE; BLACK PHOSPHORUS; CRYSTALLOGRAPHIC ORIENTATION; PHONON INTERACTIONS; LAYER GRAPHENE; 2D MATERIALS; SCATTERING;
D O I
10.1021/acs.analchem.3c00272
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
[No abstract available]
引用
收藏
页码:10821 / 10838
页数:18
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