This article examines the profitability of technical analysis on the Shanghai Stock Exchange Composite Index (SSEC) and the Growth Enterprise Market (GEM) Index, employing stepwise generalized error rate control procedures to address the data-snooping bias. Our comprehensive study encompasses 38,456 trading rules, extending beyond prior research by incorporating simple rules alongside their contrarian and complex counterparts. Upon rectifying data-snooping bias, we show that only a few complex rules outperform SSEC in different testing sub-periods, and no trading rules outperform GEM. As the outperforming rules are based on relatively high frequent trades, most lucrative rules yield negative returns in the out-of-sample periods once transaction costs were considered. Our new findings shed light on the efficiency of the Chinese stock market from 2010 to 2021.
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E China Univ Sci & Technol, Sch Business, Dept Finance, Shanghai 200237, Peoples R ChinaE China Univ Sci & Technol, Sch Business, Dept Finance, Shanghai 200237, Peoples R China
Zhu, Hong
Jiang, Zhi-Qiang
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E China Univ Sci & Technol, Sch Business, Dept Finance, Shanghai 200237, Peoples R China
E China Univ Sci & Technol, Res Ctr Econophys, Shanghai 200237, Peoples R ChinaE China Univ Sci & Technol, Sch Business, Dept Finance, Shanghai 200237, Peoples R China
Jiang, Zhi-Qiang
Li, Sai-Ping
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E China Univ Sci & Technol, Res Ctr Econophys, Shanghai 200237, Peoples R China
Acad Sinica, Inst Phys, Taipei 11529, TaiwanE China Univ Sci & Technol, Sch Business, Dept Finance, Shanghai 200237, Peoples R China
Li, Sai-Ping
Zhou, Wei-Xing
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E China Univ Sci & Technol, Sch Business, Dept Finance, Shanghai 200237, Peoples R China
E China Univ Sci & Technol, Res Ctr Econophys, Shanghai 200237, Peoples R China
E China Univ Sci & Technol, Sch Sci, Dept Math, Shanghai 200237, Peoples R ChinaE China Univ Sci & Technol, Sch Business, Dept Finance, Shanghai 200237, Peoples R China
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Univ Fed Sao Joao del Rei UFSJ, Dept Tecnol DTECH, Ouro Branco, MG, BrazilUniv Fed Sao Joao del Rei UFSJ, Dept Tecnol DTECH, Ouro Branco, MG, Brazil
Leles, M. C. R.
Pereira, M. V. L.
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Univ Fed Sao Joao del Rei UFSJ, Dept Tecnol DTECH, Ouro Branco, MG, Brazil
Univ Fed Minas Gerais UFMG, Belo Horizonte, MG, BrazilUniv Fed Sao Joao del Rei UFSJ, Dept Tecnol DTECH, Ouro Branco, MG, Brazil
Pereira, M. V. L.
Iquiapaza, R. A.
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Univ Fed Minas Gerais UFMG, Dept Ciencias Adm CAD, Belo Horizonte, MG, BrazilUniv Fed Sao Joao del Rei UFSJ, Dept Tecnol DTECH, Ouro Branco, MG, Brazil
Iquiapaza, R. A.
Sbruzzi, E. F.
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Inst Tecnol Aeronaut ITA, Div Ciencia Comp IEC, Sao Jose Dos Campos, SP, BrazilUniv Fed Sao Joao del Rei UFSJ, Dept Tecnol DTECH, Ouro Branco, MG, Brazil
Sbruzzi, E. F.
Nascimento Junior, C. L.
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Inst Tecnol Aeronaut ITA, Div Engn Eletron IEE, Sao Jose Dos Campos, SP, BrazilUniv Fed Sao Joao del Rei UFSJ, Dept Tecnol DTECH, Ouro Branco, MG, Brazil
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Northeastern Illinois University, Chicago
College of Business, Northeastern Illinois University, Chicago, IL 60625Northeastern Illinois University, Chicago
Balsara N.
Chen J.
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University of Illinois, ChicagoNortheastern Illinois University, Chicago
Chen J.
Zheng L.
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Mercer University, AtlantaNortheastern Illinois University, Chicago