Effects of misfit dislocations and dislocation mobility on thermal boundary resistance of PbTe/PbSe interfaces

被引:2
|
作者
Taormina, Nicholas [1 ]
Li, Yang [1 ]
Phillpot, Simon [2 ]
Chen, Youping [1 ]
机构
[1] Univ Florida, Dept Mech & Aerosp Engn, Gainesville, FL 32611 USA
[2] Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32611 USA
基金
美国国家科学基金会;
关键词
STRAIN RELAXATION; HEAT-TRANSPORT; DYNAMICS; PHONONS;
D O I
10.1016/j.commatsci.2024.112828
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present a molecular dynamics study of the thermal transport properties of PbTe/PbSe (1 1 1) and PbTe/PbSe (100) interfaces at room temperature. The PbTe/ PbSe heterostructures are obtained through simulations of the kinetic processes of direct bonding of PbTe and PbSe crystals. The atomic -scale dislocation core structures and the misfit dislocation networks in the heterostructures obtained in the simulations are found to closely match experimental data. Two types of heat transfer experiments are then simulated: a heat -sink heat -source experiment and an ultrashort heat pulse experiment. Thermal boundary resistance is calculated for three distinct interface types: coherent, semi -coherent, and semi -coherent with pinned dislocations. Both types of simulations consistently capture the significant role of the misfit dislocations on thermal resistance. The effect of the mobility of dislocations on thermal resistance is demonstrated for the first time through comparing the thermal boundary resistance of interfaces containing pinned dislocations and with those containing unpinned dislocations. In addition, the thermal boundary resistance is found to strongly depend on the length of the specimen and the area of the interface.
引用
收藏
页数:9
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