Influence of Si atoms on the structure and electronic properties of amorphous DLC films

被引:6
|
作者
Ryaguzov, Alexander [1 ]
Kudabayeva, Madina [1 ]
Myrzabekova, Markizat [1 ]
Nemkayeva, Renata [1 ]
Guseinov, Nazim [1 ,2 ]
机构
[1] Al Farabi Kazakh Natl Univ, Natl Nanotechnol Lab Open Type, Alma Ata, Kazakhstan
[2] KAZALFATECH LTD Res Ctr, Alma Ata, Kazakhstan
关键词
Diamond-like carbon; Thin film; Microscopy; Nanostructure; Nanocrystal; Spectroscopy; Photoluminescence; SILICON-CARBIDE; OPTICAL-PROPERTIES; RAMAN-SPECTRA; TRIBOLOGICAL PROPERTIES; MECHANICAL-PROPERTIES; XPS; PHOTOLUMINESCENCE; SPECTROSCOPY; SCATTERING; POWDERS;
D O I
10.1016/j.jnoncrysol.2022.121956
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The paper considers the effect of silicon on the formation of the structure and properties of amorphous diamondlike carbon (DLC) films. Thin films of silicon-modified amorphous diamond-like carbon (DLC:Si) were synthesized by magnetron ion-plasma co-sputtering of a combined target. Studies of the structure and properties of amorphous DLC:Si films were carried out in the range of silicon concentrations up to 6.75 at.%. A change in the formation of the film structure is shown using atomic force microscopy (AFM) and transmission electron microscopy (TEM). Raman spectroscopy (RS) and X-ray photoelectron spectroscopy (XPS) revealed a significant change in the local structure of amorphous DLC:Si films. Which, in turn, leads to a change in the density of states of pi-electrons in the band and, as a rule, to a change in the electronic properties.
引用
收藏
页数:11
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