Comparison of Proton and Gamma Irradiation on Single-Photon Avalanche Diodes

被引:0
|
作者
Xun, Mingzhu [1 ,2 ,3 ]
Li, Yudong [1 ,2 ]
Liu, Mingyu [1 ,2 ,3 ]
机构
[1] Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, State Key Lab Funct Mat & Devices Special Environm, Urumqi 830011, Peoples R China
[2] Xinjiang Key Lab Extreme Environm Elect, Urumqi 830011, Peoples R China
[3] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
关键词
SPADs; proton irradiation; gamma irradiation; I-V characteristics; IMPACT IONIZATION; CMOS SPADS; RADIATION; DAMAGE; DETECTORS; NOISE; SIMULATION; EFFICIENCY; GAIN; SI;
D O I
10.3390/electronics13061086
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, the effects of proton and gamma irradiation on reach-through single-photon avalanche diodes (SPADs) are investigated. The I-V characteristics, gain and spectral response of SPAD devices under proton and gamma irradiation were measured at different proton energies and irradiation bias conditions. Comparison experiments of proton and gamma irradiation were performed in the radiation environment of geosynchronous transfer orbit (GTO) with two different radiation shielding designs at the same total ionizing dose (TID). The results show that after 30 MeV and 60 MeV proton irradiation, the leakage current and gain increase, while the spectral response decreases slightly. The leakage current degradation is more severe under the "ON"-bias condition compared to the "OFF"-bias condition, and it is more sensitive to the displacement radiation damage caused by protons compared to gamma rays under the same TID. Further analysis reveals that the non-elastic and elastic cross-section of protons in silicon is 1.05 x 105 times greater than that of gamma rays. This results in SPAD devices being more sensitive to displacement radiation damage than ionizing radiation damage. Under the designed shielding conditions, the leakage current, gain and spectral response parameters of SPADs do not show significant performance degradation in the orbit.
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页数:14
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