Electroencephalogram-based cognitive load level classification using wavelet decomposition and support vector machine

被引:10
|
作者
Khanam, Farzana [1 ]
Hossain, A. B. M. Aowlad [2 ]
Ahmad, Mohiuddin [3 ]
机构
[1] Khulna Univ Engn & Technol KUET, Dept Biomed Engn, Khulna 9203, Bangladesh
[2] Khulna Univ Engn & Technol KUET, Dept Elect & Commun Engn, Khulna, Bangladesh
[3] Khulna Univ Engn & Technol KUET, Dept Elect & Elect Engn, Khulna, Bangladesh
关键词
Electroencephalogram (EEG); cognitive load; classification; n-back test; discrete wavelet transform (DWT); support vector machine (SVM); FEATURE-EXTRACTION; EEG; PCA;
D O I
10.1080/2326263X.2022.2109855
中图分类号
R318 [生物医学工程];
学科分类号
0831 ;
摘要
Cognitive load level identification is an interesting challenge in the field of brain-computer-interface. The sole objective of this work is to classify different cognitive load levels from multichannel electroencephalogram (EEG) which is computationally though-provoking task This proposed work utilized discrete wavelet transform (DWT) to decompose the EEG signal for extracting the non-stationary features of task-wise EEG signals. Furthermore, a support vector machine (SVM) implemented to classify the task from the DWT-based extracted features.. The proposed methodology has been implemented on a renowned EEG dataset that captured three levels of cognitive load from the n-back test. In this work, two different approaches: r) Low vs High cognitive load (0-back vs [2-back+3-back]) and ii) Low vs Medium vs High (0-back vs 2-back vs 3-back) are investigated for the performance measurement. The linear SVM achieved the highest average classification accuracy that is 77.20 +/- 6.63 and 87.89 +/- 7.3 for 3-class and 2-class approaches, respectively.
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页码:1 / 15
页数:15
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