Random Telegraph Noise and Bias Temperature Instabilities statistical characterization of O-gate FDSOI devices at low voltages

Random Telegraph Noise (RTN) and Bias Temperature Instabilities (BTI) are two mechanisms that can significantly reduce the performance and reliability of integrated circuits. In scaled devices, both phenomena are stochastic, so that a statistical analysis is required to accurately evaluate their impact on a particular technology. This study presents such analysis in scaled FD-SOI devices under various gate and drain voltages, ranging from near-threshold to nominal conditions. The combined effect of RTN and BTI is also modeled in a defect-centric context, and the main impact of the different bias conditions is discussed.