Anomalous increase of leakage current in epoxy moulding compounds under wet conditions

被引：4

作者：

Balestra, Luigi ^{[1
,2
]}

Cirioni, Leonardo ^{[1
,2
]}

Cavallini, Andrea ^{[1
,2
]}

Reggiani, Susanna ^{[1
,2
]}

Rossetti, Mattia ^{[3
]}

Gallo, Michele ^{[3
]}

Guarnera, Simone ^{[3
]}

Depetro, Riccardo ^{[3
]}

机构：

[1] Univ Bologna, ARCES, Bologna, Italy

[2] Univ Bologna, DEI, Bologna, Italy

[3] STMicroelect, Smart Power R&D, Cornaredo, Italy

来源：

SOLID-STATE ELECTRONICS | 2023年 / 208卷

关键词：

Epoxy mould compound; Moisture; TCAD; Conductivity; HV-ICS;

D O I：

10.1016/j.sse.2023.108728

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An interdigitated capacitor embedded in the EMC has been realized and characterized under controlled humidity conditions by applying a DC step voltage and monitoring the leakage current as a function of time. Both experimental characterization and TCAD simulations of dry and wet EMC samples have been carried out to fully understand the involved charge transport mechanisms. The anomalous increase of current with time in wet conditions is explained assuming a build-up of space charge directly induced by the high-injection at the metal electrodes. The assumption is confirmed by TCAD simulations.

引用

页数：4

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