AlN/AlGaN/AlN quantum well channel HEMTs

被引:5
|
作者
Singhal, Jashan [1 ]
Kim, Eungkyun [1 ]
Hickman, Austin [2 ]
Chaudhuri, Reet [1 ]
Cho, Yongjin [1 ]
Xing, Huili Grace [1 ,3 ,4 ]
Jena, Debdeep [1 ,3 ,4 ]
机构
[1] Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA
[2] Soctera Inc, 350F Duffield Hall, Ithaca, NY 14853 USA
[3] Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA
[4] Cornell Univ, Kavli Inst Cornell Nanoscale Sci, Ithaca, NY 14853 USA
关键词
VOLTAGE;
D O I
10.1063/5.0145582
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present a compositional dependence study of electrical characteristics of AlxGa1-xN quantum well channel-based AlN/AlGaN/AlN high electron mobility transistors (HEMTs) with x = 0.25 , 0.44, and 0.58. This ultra-wide bandgap heterostructure is a candidate for next-generation radio frequency and power electronics. The use of selectively regrown n-type GaN Ohmic contacts results in contact resistance that increases as the Al content of the channel increases. The DC HEMT device characteristics reveal that the maximum drain current densities progressively reduce from 280 to 30 to 1.7 mA/mm for x = 0.25 , 0.44, and 0.58, respectively. This is accompanied by a simultaneous decrease (in magnitude) in threshold voltage from -5.2 to -4.9 to -2.4 V for the three HEMTs. This systematic experimental study of the effects of Al composition x on the transistor characteristics provides valuable insights for engineering AlGaN channel HEMTs on AlN for extreme electronics at high voltages and high temperatures.
引用
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页数:6
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