Some Recent Advances in Measurements at Millimeter-Wave and Terahertz Frequencies: Advances in High Frequency Measurements

被引：8

作者：

Shang, Xiaobang ^{[1
]}

Ridler, Nick ^{[1
]}

Stokes, Daniel ^{[1
]}

Skinner, James ^{[1
]}

Mubarak, Faisal ^{[2
]}

Arz, Uwe ^{[3
]}

Phung, Gia Ngoc ^{[3
]}

Kuhlmann, Karsten ^{[3
]}

Kazemipour, Alireza ^{[4
]}

Hudlicka, Martin ^{[5
]}

Ziade, Francois ^{[6
]}

机构：

[1] Natl Phys Lab, Teddington TW11 0LW, England

[2] VSL Dutch Metrol Inst, NL-2629 Delft, Netherlands

[3] Phys Tech, D-38116 Bundesanstalt, Germany

[4] Eidgenoss Inst Metrol METAS, Koniz, Switzerland

[5] Czech Metrol Inst, Prague 10200, Czech Republic

[6] Lab Natl Metrol & Essais, F-78197 Trappes, France

来源：

IEEE MICROWAVE MAGAZINE | 2024年 / 25卷 / 01期

关键词：

Microwave measurement; Power measurement; Permittivity measurement; Millimeter wave measurements; Thermal sensors; Millimeter wave radar; Microwave communication; ON-WAFER;

D O I：

10.1109/MMM.2023.3321516

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The millimeter-wave (mm-wave) and terahertz (THz) regions of the electromagnetic spectrum are seeing increasing prominence, with a range of established and emerging applications-wireless backhaul for mobile networks for 5G and 6G infrastructure, automotive radar sensors, space-deployed radiometers for Earth observation, climate monitoring, weather forecasting, and more-exploiting these frequencies. Measurement techniques informed by the latest metrological research into the measurement of electrical quantities underpin the development of components and circuits for such applications by enabling the accurate and consistent measurement results to be obtained.

引用

页码：58 / 71

页数：14

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