A greedy-based crow search algorithm for semiconductor final testing scheduling problem

被引:2
|
作者
Hu, Weiguo [1 ]
Liu, Min [1 ]
Dong, Mingyu [1 ]
Liu, Tao [1 ]
Zhang, Yabin [1 ]
Cheng, Guanyi [2 ]
机构
[1] Tsinghua Univ, Beijing, Peoples R China
[2] Yangtze Memory Technol Co Ltd, Wuhan, Peoples R China
基金
中国国家自然科学基金;
关键词
Semiconductor final testing scheduling; problem; Crow search algorithm; Greedy-based; Makespan; OPTIMIZATION ALGORITHM; TEST OPERATIONS;
D O I
10.1016/j.cie.2023.109423
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
The semiconductor final testing scheduling problem (SFTSP) is of great importance to the efficiency of integrated circuit firms and has been widely investigated in the field of intelligent optimization. In this paper, a greedy-based crow search algorithm (GCSA) is presented for solving the SFTSP. According to the characteristics of SFTSP, new encoding and decoding strategies are proposed to link the feasible solutions to the scheduling schemes. The search operations are performed only in the operation sequence space, and a corresponding ma-chine allocation vector is generated for each operation sequence vector based on the greed mechanism. Two crow position update strategies named track and hover are redesigned and the improved crow search algorithm is utilized to search the operation sequence space efficiently in order that the GCSA can adapt the SFTSP and make full use of the information obtained during the search process. Moreover, the effect of parameters is investigated based on a multi-factor analysis of variance (ANOVA) approach. Finally, extensive computations and compari-sons on ten test instances derived from the practical production demonstrate that the proposed GCSA out-performs the state-of-the-art methods in the literature to solve the SFTSP.
引用
收藏
页数:14
相关论文
共 50 条
  • [1] An Improved Cuckoo Search Algorithm for Semiconductor Final Testing Scheduling
    Cao, ZhengCai
    Lin, ChengRan
    Zhou, MengChu
    Huang, Ran
    2017 13TH IEEE CONFERENCE ON AUTOMATION SCIENCE AND ENGINEERING (CASE), 2017, : 1040 - 1045
  • [2] A greedy-based neighborhood search approach to a nurse rostering problem
    Bellanti, F
    Carello, G
    Della Croce, F
    Tadei, R
    EUROPEAN JOURNAL OF OPERATIONAL RESEARCH, 2004, 153 (01) : 28 - 40
  • [3] A hybrid estimation of distribution algorithm for the semiconductor final testing scheduling problem
    Wang, Shengyao
    Wang, Ling
    Liu, Min
    Xu, Ye
    JOURNAL OF INTELLIGENT MANUFACTURING, 2015, 26 (05) : 861 - 871
  • [4] A hybrid estimation of distribution algorithm for the semiconductor final testing scheduling problem
    Shengyao Wang
    Ling Wang
    Min Liu
    Ye Xu
    Journal of Intelligent Manufacturing, 2015, 26 : 861 - 871
  • [5] A novel fruit fly optimization algorithm for the semiconductor final testing scheduling problem
    Zheng, Xiao-long
    Wang, Ling
    Wang, Sheng-yao
    KNOWLEDGE-BASED SYSTEMS, 2014, 57 : 95 - 103
  • [6] An effective invasive weed optimization algorithm for scheduling semiconductor final testing problem
    Sang, Hong-Yan
    Duan, Pei-Yong
    Li, Jun-Qing
    SWARM AND EVOLUTIONARY COMPUTATION, 2018, 38 : 42 - 53
  • [7] A knowledge-based multi-agent evolutionary algorithm for semiconductor final testing scheduling problem
    Wang, Shengyao
    Wang, Ling
    KNOWLEDGE-BASED SYSTEMS, 2015, 84 : 1 - 9
  • [8] Greedy-Based Precise Expansion Algorithm for Customized Group Team Formation Problem
    Yeh, Pei-Yi
    Li, Shiou-Chi
    Ma, Hao-Shang
    Huang, Jen-Wei
    2022 INTERNATIONAL CONFERENCE ON TECHNOLOGIES AND APPLICATIONS OF ARTIFICIAL INTELLIGENCE, TAAI, 2022, : 119 - 124
  • [9] A new EDA algorithm combined with Q-learning for semiconductor final testing scheduling problem
    Zhang, Long
    Lin, Yi
    Xu, Chuanpei
    Liu, Min
    COMPUTERS & INDUSTRIAL ENGINEERING, 2024, 193
  • [10] Permutation flow-shop scheduling problem based on new hybrid crow search algorithm
    Yan H.
    Tang W.
    Yao B.
    Jisuanji Jicheng Zhizao Xitong/Computer Integrated Manufacturing Systems, CIMS, 2024, 30 (05): : 1834 - 1846