Two-dimensional transition-metal dichalcogenides (TMDs) have attracted tremendous interest due to the unusual electronic and optoelectronic properties of isolated monolayers and the ability to assemble diverse monolayers into complex heterostructures. To understand the intrinsic properties of TMDs and fully realize their potential in applications and fundamental studies, high-purity materials are required. Here, we describe the synthesis of TMD crystals using a two-step flux growth method that eliminates a major potential source of contamination. Detailed characterization of TMDs grown by this two-step method reveals charged and isovalent defects with densities an order of magnitude lower than those in TMDs grown by a single-step flux technique. For WSe2, we show that increasing the Se/W ratio during growth reduces point defect density, with crystals grown at 100:1 ratio achieving charged and isovalent defect densities below 10(10) and 10(11) cm(-2), respectively. Initial temperature-dependent electrical transport measurements of monolayer WSe2 yield room-temperature hole mobility above 840 cm(2)/(V s) and low-temperature disorder-limited mobility above 44,000 cm(2)/(V s). Electrical transport measurements of graphene-WSe2 heterostructures fabricated from the two-step flux grown WSe2 also show superior performance: higher graphene mobility, lower charged impurity density, and well-resolved integer quantum Hall states. Finally, we demonstrate that the two-step flux technique can be used to synthesize other TMDs with similar defect densities, including semiconducting 2H-MoSe2 and 2H-MoTe2 and semimetallic T-d-WTe2 and 1T'-MoTe2.
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US Air Force, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
UES Inc, Dayton, OH 45432 USAUS Air Force, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Altvater, Michael
Muratore, Christopher
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Univ Dayton, Dept Chem & Mat Engn, Dayton, OH 45469 USAUS Air Force, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Muratore, Christopher
Snure, Michael
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US Air Force, Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAUS Air Force, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Snure, Michael
Glavin, Nicholas R.
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US Air Force, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USAUS Air Force, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
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Kansas Academy of Mathematics and Science, Fort Hays State UniversityKansas Academy of Mathematics and Science, Fort Hays State University
Shuxian Wang
Zhihao Yu
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National Laboratory of Solid State Microstructures, School of Electronic Science and Engineering, and Collaborate Innovation Center of Advanced Microstructures, NanjingKansas Academy of Mathematics and Science, Fort Hays State University
Zhihao Yu
Xinran Wang
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National Laboratory of Solid State Microstructures, School of Electronic Science and Engineering, and Collaborate Innovation Center of Advanced Microstructures, NanjingKansas Academy of Mathematics and Science, Fort Hays State University