Deep Learning-Based Material Characterization Using FMCW Radar With Open-Set Recognition Technique

被引:1
|
作者
Abouzaid, Salah [1 ]
Jaeschke, Timo [2 ]
Kueppers, Simon [2 ]
Barowski, Jan [3 ]
Pohl, Nils [1 ,4 ]
机构
[1] Ruhr Univ Bochum, Inst Integrated Syst, D-44801 Bochum, Germany
[2] 2pi LABS GmbH, Bochum, Germany
[3] Ruhr Univ Bochum, Inst Microwave Syst, D-44801 Bochum, Germany
[4] Fraunhofer Inst High Frequency Phys & Radar Tech F, D-53343 Wachtberg, Germany
关键词
Class anchor clustering (CAC); frequency-modulated continuous wave (FMCW) radar; K-means clustering; material characterization; material classification; open-set recog-nition (OSR); vector network analyzer (VNA); BAND;
D O I
10.1109/TMTT.2023.3276053
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article proposes a low-cost and practical alter-native to vector network analyzers (VNAs) for characterizing dielectric materials using a calibrated frequency-modulated con-tinuous wave (FMCW) radar measurement setup and a machine learning (ML) model. The calibrated FMCW radar measurement setup has the ability to accurately measure the S-parameters of dielectric materials. In addition, an ML model is developed to extract material parameters such as thickness, dielectric constant, and loss tangent with high accuracy. K-means clustering was additionally applied to significantly reduce the complexity of the neural network (NN). Additionally, a state-of-the-art open -set recognition (OSR) technique was adopted to simultaneously classify known classes and reject unknown classes. The developed model uses a modified version of the class anchor clustering (CAC) distance-based loss, which outperforms the conventional cross-entropy loss. The proposed model was evaluated on several dielectric materials and compared to reference measurements using a VNA and curve fitting. The results indicate that the proposed model is accurate and robust, and that the calibrated radar sensor provides a practical and cost-effective alternative to VNAs in characterizing dielectric materials, as long as the material parameters are within the defined limits.
引用
收藏
页码:4628 / 4638
页数:11
相关论文
共 50 条
  • [1] Open-set iris recognition based on deep learning
    Sun, Jie
    Zhao, Shipeng
    Miao, Sheng
    Wang, Xuan
    Yu, Yanan
    [J]. IET IMAGE PROCESSING, 2022, 16 (09) : 2361 - 2372
  • [2] Open-Set Patient Activity Recognition With Radar Sensors and Deep Learning
    Bhavanasi, Geethika
    Werthen-Brabants, Lorin
    Dhaene, Tom
    Couckuyt, Ivo
    [J]. IEEE GEOSCIENCE AND REMOTE SENSING LETTERS, 2023, 20
  • [3] Open-Set Patient Activity Recognition With Radar Sensors and Deep Learning
    Bhavanasi, Geethika
    Werthen-Brabants, Lorin
    Dhaene, Tom
    Couckuyt, Ivo
    [J]. IEEE GEOSCIENCE AND REMOTE SENSING LETTERS, 2023, 20
  • [4] Deep Active Learning via Open-Set Recognition
    Mandivarapu, Jaya Krishna
    Camp, Blake
    Estrada, Rolando
    [J]. FRONTIERS IN ARTIFICIAL INTELLIGENCE, 2022, 5
  • [5] Open-Set Radar Emitter Recognition via Deep Metric Autoencoder
    Yang, Chen
    Liu, Huiling
    Yang, Shuyuan
    Feng, Zhixi
    Tang, Xiaogang
    Zhang, Feng
    [J]. IEEE INTERNET OF THINGS JOURNAL, 2024, 11 (10): : 18281 - 18291
  • [6] Open-Set Recognition of Wood Species Based on Deep Learning Feature Extraction Using Leaves
    Fang, Tianyu
    Li, Zhenyu
    Zhang, Jialin
    Qi, Dawei
    Zhang, Lei
    [J]. JOURNAL OF IMAGING, 2023, 9 (08)
  • [7] An Open-Set Modulation Recognition Scheme With Deep Representation Learning
    Chen, Yanghong
    Xu, Xiaodong
    Qin, Xiaowei
    [J]. IEEE COMMUNICATIONS LETTERS, 2023, 27 (03) : 851 - 855
  • [8] Deep metric learning method for open-set iris recognition
    Huo, Guang
    Li, Ruyuan
    Lou, Jianlou
    Yu, Xiaolu
    Wang, Jiajun
    He, Xinlei
    Wang, Yue
    [J]. JOURNAL OF ELECTRONIC IMAGING, 2024, 33 (03)
  • [9] Open-Set Plankton Recognition Using Similarity Learning
    Mohamed, Ola Badreldeen Bdawy
    Eerola, Thomas
    Kraft, Kaisa
    Lensu, Lasse
    Kalviainen, Heikki
    [J]. ADVANCES IN VISUAL COMPUTING, ISVC 2022, PT I, 2022, 13598 : 174 - 183
  • [10] Learning Placeholders for Open-Set Recognition
    Zhou, Da-Wei
    Ye, Han-Jia
    Zhan, De-Chuan
    [J]. 2021 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, CVPR 2021, 2021, : 4399 - 4408