Reliability of three-dimensional consecutive k-type systems

被引:7
|
作者
Yi, He [1 ]
Balakrishnan, Narayanaswamy [2 ]
Li, Xiang [1 ]
机构
[1] Beijing Univ Chem Technol, Sch Econ & Management, Beijing, Peoples R China
[2] McMaster Univ, Dept Math & Stat, Hamilton, ON, Canada
基金
中国国家自然科学基金; 加拿大自然科学与工程研究理事会;
关键词
Reliability; Three-dimensional consecutive k -type system; Overlapping; Finite Markov chain imbedding approach <span style="color; #c71585">(FMCIA<span style="color; #c71585">); Non-overlapping; S)-OUT-OF-(M;
D O I
10.1016/j.ress.2023.109131
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Three-dimensional consecutive k-type systems are widely found in reliability practice such as in sensing systems, but it is not an easy task to evaluate reliability of these systems. In this paper, several three-dimensional consecutive k-type systems, namely, linear connected -(k1, k2, k3)-out-of -(n1, n2, n3) : F system, linear con-nected -(k1, k2, k3)!-out-of -(n1, n2,n3) : F system, and linear l-connected -(k1, k2, k3)-out-of -(n1, n2, n3) : F system, without/with overlapping, are studied. Reliability of these systems is determined by using finite Markov chain imbedding approach (FMCIA), and some specific techniques are employed to reduce the state space of the involved Markov chain. Some numerical illustrative examples are then provided to demonstrate the accuracy and efficiency of the proposed method, and finally some possible applications and generalizations are pointed out.
引用
收藏
页数:12
相关论文
共 50 条
  • [1] Reliability analyses of linear two-dimensional consecutive k-type systems
    Yi, He
    Balakrishnan, Narayanaswamy
    Li, Xiang
    JOURNAL OF APPLIED PROBABILITY, 2024, 61 (02) : 439 - 464
  • [2] Joint reliability of linear consecutive k-type systems with shared components in a zigzag structure
    Yi, He
    Balakrishnan, Narayanaswamy
    Li, Xiang
    RELIABILITY ENGINEERING & SYSTEM SAFETY, 2024, 241
  • [3] The orbits of three K-type spectroscopic binaries
    Christie, WH
    ASTROPHYSICAL JOURNAL, 1934, 80 (03): : 181 - 189
  • [4] Contribution of the three-dimensional model to the reliability allocation of multiphase systems
    Saadi, Saadia
    Djebabra, Mebarek
    Roudies, Ounsa
    Boulagouas, Wafa
    INTERNATIONAL JOURNAL OF QUALITY & RELIABILITY MANAGEMENT, 2019, 36 (07) : 1038 - 1052
  • [5] Board level reliability of three-dimensional systems in package (SIPs)
    Sugiyama, T
    Yano, Y
    Ishihara, S
    Maruyama, T
    Juso, H
    Kimura, T
    Kada, M
    53RD ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2003 PROCEEDINGS, 2003, : 1106 - 1111
  • [6] Evaluating methods for the reliability of a three-dimensional k-within system
    Akiba, Tomoaki
    Yamamoto, Hisashi
    Tsujimura, Yasuhiro
    JOURNAL OF QUALITY IN MAINTENANCE ENGINEERING, 2005, 11 (03) : 254 - +
  • [7] Reliability bounds for two dimensional consecutive systems
    Beiu, Valeriu
    Daus, Leonard
    NANO COMMUNICATION NETWORKS, 2015, 6 (03) : 145 - 152
  • [8] RELIABILITY AND DESIGN OF 2-DIMENSIONAL CONSECUTIVE-K-OUT-OF-N SYSTEMS
    ZUO, MJ
    IEEE TRANSACTIONS ON RELIABILITY, 1993, 42 (03) : 488 - 490
  • [9] RELIABILITY OF 2-DIMENSIONAL CONSECUTIVE-K-OUT-OF-N - F SYSTEMS
    KOUTRAS, MV
    PAPADOPOULOS, GK
    PAPASTAVRIDIS, SG
    IEEE TRANSACTIONS ON RELIABILITY, 1993, 42 (04) : 658 - 661
  • [10] Reliability Analysis of Three-Dimensional Shipboard Electrical Power Distribution Systems
    Dubey, Anamika
    Santoso, Surya
    Arapostathis, Aristotle
    2015 IEEE ELECTRIC SHIP TECHNOLOGIES SYMPOSIUM (ESTS), 2015, : 93 - 98