Effect of thickness in the SAC 305 plated layer on the interfacial reaction and mechanical properties of the CCSB joint assembled onto the OSP surface finished FR-4 PCB board

被引:0
|
作者
Son, Jae-yeol [1 ]
Kang, Donggil [1 ]
Jeong, Haksan [1 ]
Jung, Seung-Boo [1 ]
机构
[1] Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, 2066 Seobu Ro, Suwon 16419, South Korea
关键词
Binary alloys - Copper - Nickel compounds;
D O I
10.1007/s10854-024-12203-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The interfacial reaction and the mechanical properties of the Cu core solder balls (CCSB) assembled on the organic solderability preservative (OSP) surface finished FR-4 substrate were investigated with various thicknesses of SAC 305 plated on Cu balls. After electroplating 2 mu m thick Ni on a 220 mu m Cu core ball, three types of CCSBs (240, 260, and 280 mu m) were fabricated by electroplating SAC 305 (Sn 3.0 Ag 0.5 Cu solder) on the top of the Ni-plated Cu core ball. After reflow, (Cu,Ni)6Sn5 intermetallic compound (IMC) was formed at the interface of the SAC 305 plated-layer and Ni plated Cu core ball, and Cu6Sn5 IMC was formed at the interface of the SAC 305-plated layer and OSP surface finished FR-4 board. The thickness of (Cu,Ni)6Sn5 decreased from 6.52 mu m to 3.48 mu m with increasing thickness of the SAC 305 plated layer, and thickness of Cu6Sn5 increased from 4.22 mu m to 5.97 mu m, respectively. After the third reflow, the shear strength of the CCSB joint decreased from 34.5 MPa to 25.2 MPa as the thickness of the SAC 305-plated layer increased because of the thick Cu6Sn5. The crack in the CCSB joints propagated mainly at the interface of the SAC 305-plated layer and Cu6Sn5 formed on the OSP surface finished FR-4 substrate.
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页数:9
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  • [1] Effect of thickness in the SAC 305 plated layer on the interfacial reaction and mechanical properties of the CCSB joint assembled onto the OSP surface finished FR-4 PCB board
    Jae-yeol Son
    Donggil Kang
    Haksan Jeong
    Seung-Boo Jung
    Journal of Materials Science: Materials in Electronics, 2024, 35
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