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- [1] TOF-SIMS Analysis for Surface Contaminant on Dielectric Anti-Reflective Coating 2017 IEEE 24TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA), 2017,
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- [9] Analysis of undoped and Ag-doped high-Tc YBCO superconducting bolometers fabricated using a novel anti-reflective coating and photolithographic technique Materials Research Society Symposium - Proceedings, 1999, 541 : 667 - 672