Investigation of structural, electrical and linear/non-linear optical properties of MgPc thin films grown by CSP technique for optoelectronic applications

Organic semiconductor MgPc thin films were grown onto n-Si, p-Si and corning glass substrates by Chemical Spray Pyrolysis (CSP) technique. The structural and surface morphological properties of MgPc thin films were investigated by XRD, RAMAN and FEG-SEM analysis. It was observed that the surface area on which MgPc thin films grow on n-Si and p-Si substrates were dendritic nanostructures and has homogeneous surface morphology. XRD patterns showed us that all organic semiconductor MgPc thin films have monoclinic alpha-phase structure with 2 theta peak at - 7.8 degrees which is 100%. X-ray diffraction and grain sizes measurements of MgPc thin films indicated that organic semiconductor MgPc thin films have nanocrystalline nature. We observed 25 Raman active peaks belonging to MgPc thin films. The diode parameters of p-MgPc/n-Si and p-MgPc/p-Si which are organic-inorganic hybrid heterojunctions have been investigated by current-voltage (I-V) measurements at room temperature in dark condition. The linear & non-linear optical properties of MgPc thin films growth on corning glass substrate were determined from transmittance and reflectance measurements. The optical bandgap of the organic MgPc semiconductor was found as 1.91 eV. The linear and nonlinear optical parameters of the organic MgPc thin film were investigated to determine the potential for use in optoelectronic applications.