Progress in Ammonothermal Crystal Growth of Gallium Nitride from 2017-2023: Process, Defects and Devices

被引:8
|
作者
Stoddard, Nathan [1 ]
Pimputkar, Siddha [1 ]
机构
[1] Lehigh Univ, Dept Mat Sci & Engn, 5 E Packer Ave, Bethlehem, PA 18015 USA
关键词
gallium nitride; ammonothermal crystal growth; wide band gap semiconductors; defects; high-power electronics; GRAIN-BOUNDARIES; GAN GROWTH; NONPOLAR; BULK;
D O I
10.3390/cryst13071004
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Gallium nitride continues to be a material of intense interest for the ongoing advancement of electronic and optoelectronic devices. While the bulk of today's markets for low-performance devices is still met with silicon and blue/UV LEDs derived from metal-organic chemical vapor deposition gallium nitride grown on foreign substrates such as sapphire and silicon carbide, the best performance values consistently come from devices built on bulk-grown gallium nitride from native seeds. The most prominent and promising of the bulk growth methods is the ammonothermal method of high-pressure solution growth. The state-of-the-art from the last five years in ammonothermal gallium nitride technology is herein reviewed within the general categories of growth technology, characterization and defects as well as device performance.
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页数:17
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