Electron beam direct write lithography: the versatile ally of optical lithography

被引:0
|
作者
Laulagnet, Fabien [1 ]
Dallery, Jacques-Alexandre [2 ]
Pain, Laurent [1 ]
May, Michael [1 ]
Hemard, Beatrice [1 ]
Garlet, Franck [1 ]
Servin, Isabelle [1 ]
Sabbione, Chiara [1 ]
机构
[1] Univ Grenoble Alpes, CEA Leti, Grenoble, France
[2] Vistec Electron Beam GmbH, Jena, Germany
关键词
electron beam; lithography; matching; negative tone development resist; hybrid lithography process; variable shaped beam system;
D O I
10.1117/1.JMM.22.4.041404
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Electron beam (E-beam) direct write (EBDW) lithography is a worldwide reference technology used in laboratories, universities, and pilot line facilities for research and development. Due to its low writing speed, EBDW has never been recognized as an acceptable industrial solution, except for optical mask manufacturing. Nevertheless, its natural high-resolution capability allows for low-cost patterning of advanced or innovative devices prior to their high-volume manufacturing ramp-up. Due to its full versatility with almost all types of chemically amplified resists, EBDW is a perfect complementary solution to optical lithography. We demonstrate the compatibility of EBDW lithography with advanced negative tone development resists and the possibility of setting up a hybrid E-beam/193i lithography process flow with high performance in terms of resolution and mix and match overlay. This high-end lithography alliance offers flexibility and cost advantages for device development research and development, as well as powerful possibilities for specific applications such as circuit encryption, as discussed at the end of our study.
引用
收藏
页数:11
相关论文
共 50 条
  • [1] High-current electron optical design for reflective electron beam lithography direct write lithography
    McCord, Mark
    Kojima, Shinichi
    Petric, Paul
    Brodie, Alan
    Sun, Jeff
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2010, 28 (06): : C6C1 - C6C5
  • [2] Direct-write electron beam lithography automatically aligned with optical lithography for device fabrication
    Rosolen, GC
    King, WD
    LITHOGRAPHY FOR SEMICONDUCTOR MANUFACTURING, 1999, 3741 : 131 - 137
  • [3] DIRECT WRITE ELECTRON BEAM LITHOGRAPHY: A HISTORICAL OVERVIEW
    Pfeiffer, Hans C.
    PHOTOMASK TECHNOLOGY 2010, 2010, 7823
  • [4] Reflective electron beam lithography: A maskless ebeam direct write lithography approach using the reflective electron beam lithography concept
    Petric, Paul
    Bevis, Chris
    McCord, Mark
    Carroll, Allen
    Brodie, Alan
    Ummethala, Upendra
    Grella, Luca
    Cheung, Anthony
    Freed, Regina
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2010, 28 (06): : C6C6 - C6C13
  • [5] Electron optical column for a multicolumn, multibeam direct-write electron beam lithography system
    Yin, E
    Brodie, AD
    Tsai, FC
    Guo, GX
    Parker, NW
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (06): : 3126 - 3131
  • [6] POSITIVE RESISTS FOR DIRECT WRITE ELECTRON-BEAM LITHOGRAPHY
    GOZDZ, AS
    SOLID STATE TECHNOLOGY, 1987, 30 (06) : 75 - 79
  • [7] Improvement in writing speed of electron beam direct-write lithography
    Chen, CY
    Su, CC
    Huang, JY
    Yang, JJ
    Lin, HY
    2004 4TH IEEE CONFERENCE ON NANOTECHNOLOGY, 2004, : 451 - 453
  • [8] DIRECT WRITE ELECTRON-BEAM LITHOGRAPHY - A PRODUCTION LINE REALITY
    PFEIFFER, HC
    SOLID STATE TECHNOLOGY, 1984, 27 (09) : 223 - 227
  • [9] On the spatial resolution limit of direct-write electron beam lithography
    Jiang, Nan
    MICROELECTRONIC ENGINEERING, 2017, 168 : 41 - 44
  • [10] Direct-write electron beam lithography: History and state of the art
    Carr, DW
    Tiberio, RC
    MATERIALS ISSUES AND MODELING FOR DEVICE NANOFABRICATION, 2000, 584 : 33 - 43