Measurement of the out-of-plane optical constants of a two-dimensional crystal

被引:0
|
作者
Merano, Michele [1 ]
机构
[1] Univ Padua, Dipartimento Fis & Astron Galileo Galilei, Via Marzolo 8, I-35131 Padua, Italy
来源
关键词
Monolayer 2D materials; Graphene; Molybdenum disulfide; Ellipsometry; Polydimethylsiloxane;
D O I
10.1117/12.2651652
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The observation of the out-of-plane optical constants of a monolayer two-dimensional crystal is a challenging task. I illustrate an experimental procedure able to observe these quantities. We measure the out-of-plane surface susceptibilities of Graphene and Molybdenum disulfide monolayers. At a wavelength of 633 nm we find values of 0.6 and 1.1 nm respectively for these two atomic crystals.
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页数:4
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