Predistortion of Charge Trapping Memory Effects in GaN based RF Power Amplifiers with Artificial Neural Networks

被引:0
|
作者
Jueschke, Patrick [1 ]
Fischer, Georg [2 ]
机构
[1] Nokia Technol Ctr, RF Transceivers & Power Amplifiers, Ulm, Germany
[2] Friedrich Alexander Univ Erlangen Nuremberg, LTE Lehrstuhl Tech Elekt, Erlangen, Germany
关键词
and reduce complexity of the feedback path; Index Terms-Digital Predistortion; Artificial Neural Networks; Memory Effects; Gallium Nitride;
D O I
10.1109/RWS56914.2024.10438563
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Energy efficiency and bandwidth of RF power amplifiers (PAs) is always a challenge for future radios. Static and dynamic nonlinear effects are responsible for degrading before mentioned parameters. Static effects can be characterized by measuring the PA output with a defined input signal. Fast changing dynamic nonlinearities like thermal memory and charge trapping effects with different time constants are more difficult to determine but have a strong influence on the transfer characteristic of the PA and require a dedicated and costly feedback path for fast adaption of the digital predistortion (DPD). This work shows a method to measure the trapping condition in the transistor to enhance the predistortion performance with artificial neural networks (ANN) and reduce complexity of the feedback path.
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页码:58 / 60
页数:3
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