A state-of-the-art review on the research and application of on-machine measurement with a touch-trigger probe

被引:10
|
作者
Zhuang, Qixin [1 ,2 ]
Wan, Neng [1 ,2 ]
Guo, Yanheng [1 ,2 ]
Zhu, Guangxu [1 ,2 ]
Qian, Deng [1 ,2 ,3 ]
机构
[1] Northwestern Polytech Univ, Sch Mech Engn, Xian 710072, Shaanxi, Peoples R China
[2] Northwestern Polytech Univ, Inst Aeroengine Smart Assembly Shaanxi Prov, Xian 710072, Shaanxi, Peoples R China
[3] Xian Space Engine Co Ltd, Xian 710065, Peoples R China
关键词
On-machine measurement; Touch-trigger probe; Path planning; Process optimization; Traceability and capability assessment; Application; THERMAL ERROR COMPENSATION; OPTIMAL MEASUREMENT AREA; TOOL PATH GENERATION; 3D THEORETICAL-MODEL; COLLISION-FREE PATH; 5-AXIS MACHINE; ACCURACY ENHANCEMENT; RADIUS COMPENSATION; GEOMETRIC ERRORS; SAMPLING METHOD;
D O I
10.1016/j.measurement.2023.113923
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In recent years, on-machine measurement (OMM) technology, which uses a touch-trigger probe (TTP) installed on the machine tool (MT) spindle, has become increasingly popular. Being distinct from the laboratory-based coordinate measuring machine (CMM), OMM has the benefits of lower cost, easy-to-use, and lower re-quirements for the working environment and operator. From this perspective, OMM has been widely used as the preferred measuring manner for the purpose of direct dimensional inspection in proactive manufacturing quality control of complex parts. As a result, a lot of research has focused on the improvement of the OMM accuracy and efficiency, and the application of OMM. Nevertheless, there are few review papers that introduce the progress of these research topics. In this paper, a comprehensive and systematic review of the state-of-the-art advances in methodologies, technologies and applications of OMM is presented. Specific topics include key technologies such as the inspection path planning, process optimization, and traceability and capability assessment of OMM, as well as the application scenarios and requirement analysis of OMM in different process stages. Moreover, challenges in the current development of OMM technology and future potential development trends are also discussed.
引用
收藏
页数:39
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