Polarized Shack-Hartmann wavefront sensor

被引:3
|
作者
Yang, Yanrong [1 ,2 ,3 ]
Huang, Linhai [4 ]
Xiao, Yawei [4 ]
Gu, Naiting [4 ,5 ]
机构
[1] Chengdu Univ Tradit Chinese Med, Coll Ophthalmol, Chengdu, Peoples R China
[2] Key Lab Sichuan Prov Ophthalmopathy Prevent & Cure, Chengdu, Peoples R China
[3] Chengdu Univ TCM, Ineye Hosp, Chengdu, Peoples R China
[4] Chinese Acad Sci, Key Lab Adapt Opt, Chengdu, Peoples R China
[5] Univ Chinese Acad Sci, Beijing, Peoples R China
基金
国家重点研发计划; 中国国家自然科学基金;
关键词
adaptive optics; Shack-Hartmann wavefront sensor (SHWFS); polarization detection method; polarized dimension; polarization imaging; ZERNIKE POLYNOMIALS;
D O I
10.3389/fphy.2023.1091848
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Shack-Hartmann wavefront sensor (SHWFS) has been widely used in adaptive optics (AO) systems to detect phase distortion characteristics. In laser communication, target detection, vision optics and other application fields, the performance of SHWFS is affected by bright skylight and scattered light, which restricted the working ability of the AO system severely. Therefore, this paper proposes a new polarized SHWFS (p-SHWFS) based on the principle of polarization imaging, which utilize the difference of state of polarization (SoP) between signal and stray light to improve the image contrast. The p-SHWFS can be composed simply by a micro-lens array and a linear polarization camera. The camera uses four directional polarizing filters at 0 degrees, 135 degrees, 45 degrees and 90 degrees on every four pixels. Thus, the degree of linear polarization (DoLP) and angle of linear polarization (AoLP) for the incident wavefront can be analyzed, and the signal-to-background ratio (SBR) can be improved in some certain depending on the difference of SoP. In this paper, we introduce the basic principle of the p-SHWFS and validate the feasibility and accuracy improvement by numerical simulation and practical experiments. The experimental results show that the p-SHWFS can improve obviously the measurement accuracy under strong stray light when the difference of SoP exists. That may give us some initial reference to reduce the influence of stray light in laser communication, target detection, vision optics and other application fields.
引用
收藏
页数:11
相关论文
共 50 条
  • [1] The Shack-Hartmann wavefront sensor
    Mansuripur, Masud
    Optics and Photonics News, 1999, 10 (04): : 48 - 51
  • [2] Wavefront reconstruction for the Shack-Hartmann wavefront sensor
    Topa, DM
    OPTICAL DESIGN AND ANALYSIS SOFTWARE II, 2002, 4769 : 101 - 115
  • [3] Reconfigurable Shack-Hartmann wavefront sensor
    Rha, J
    Voelz, DG
    Giles, MK
    OPTICAL ENGINEERING, 2004, 43 (01) : 251 - 256
  • [4] RGB Shack-Hartmann wavefront sensor
    Jain, Prateek
    Schwiegerling, Jim
    JOURNAL OF MODERN OPTICS, 2008, 55 (4-5) : 737 - 748
  • [5] Educational Shack-Hartmann wavefront sensor
    Hassani, Khosrow
    Khajehhassanirabori, Veyana
    AMERICAN JOURNAL OF PHYSICS, 2025, 93 (03) : 264 - 271
  • [6] Wavefront subaperture stitching with Shack-Hartmann sensor
    Li, Hongru
    Feng, Guoying
    Sun, Jianfei
    Bourgade, Thomas
    Zhou, Shouhuan
    Asundi, Anand
    INTERNATIONAL CONFERENCE ON OPTICAL AND PHOTONIC ENGINEERING (ICOPEN 2015), 2015, 9524
  • [7] Holographic imaging with a Shack-Hartmann wavefront sensor
    Gong, Hai
    Soloviev, Oleg
    Wilding, Dean
    Pozzi, Paolo
    Verhaegen, Michel
    Vdovin, Gleb
    OPTICS EXPRESS, 2016, 24 (13): : 13729 - 13737
  • [8] Aspheric metrology with a Shack-Hartmann wavefront sensor
    Greivenkamp, JE
    Smith, DG
    Gappinger, RO
    Williby, GA
    4TH IBEROAMERICAN MEETING ON OPTICS AND 7TH LATIN AMERICAN MEETING ON OPTICS, LASERS, AND THEIR APPLICATIONS, 2001, 4419 : 1 - 4
  • [9] Tolerancing and compensation of a Shack-Hartmann wavefront sensor
    Smith, Daniel G.
    Greivenkamp, John E.
    OPTICAL SYSTEM ALIGNMENT AND TOLERANCING, 2007, 6676
  • [10] Shack-Hartmann wavefront sensor precision and accuracy
    Neal, DR
    Copland, J
    Neal, D
    ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICAL, SEMICONDUCTOR, AND DATA STORAGE COMPONENTS, 2002, 4779 : 148 - 160