Power divergence approach for one-shot device testing under competing risks

被引：2

作者：

Balakrishnan, N. ^{[1
]}

Castilla, E. ^{[2
]}

Martin, N. ^{[3
]}

Pardo, L. ^{[4
]}

机构：

[1] McMaster Univ, Dept Math & Stat, Hamilton, ON L8S4K1, Canada

[2] Univ Rey Juan Carlos, Dept Matemat Aplicada Ciencia & Ingn Mat & Tecnol, Madrid 28933, Spain

[3] Univ Complutense Madrid, Dept Financial & Actuarial Econ & Stat, Madrid, Spain

[4] Univ Complutense Madrid, Dept Stat & OR, Madrid, Spain

来源：

JOURNAL OF COMPUTATIONAL AND APPLIED MATHEMATICS | 2023年 / 419卷

关键词：

One-shot devices; Robustness; Reliability; Minimum DPD estimators; Wald-type tests; ROBUST ESTIMATION; REGRESSION;

D O I：

10.1016/j.cam.2022.114676

中图分类号：

O29 [应用数学];

学科分类号：

070104 ;

摘要：

Most work on one-shot devices assume that there is only one possible cause of device failure. However, in practice, it is often the case that the products under study can experience any one of various possible causes of failure. Robust estimators and Wald-type tests are developed here for the case of one-shot devices under competing risks. An extensive simulation study illustrates the robustness of these divergence-based estimators and test procedures based on them. A data-driven procedure is proposed for choosing the optimal estimator for any given data set which is then applied to an example in the context of survival analysis. (c) 2022 Elsevier B.V. All rights reserved.

引用

页数：17

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