Gate-tunable hysteresis response of field effect transistor based on sulfurized Mo

被引:0
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作者
Mathew, S. [1 ]
Reiprich, J. [1 ]
Narasimha, S. [1 ]
Abedin, S. [1 ]
Kurtash, V. [1 ]
Thiele, S. [1 ]
Scheler, T. [2 ]
Haehnlein, B. [3 ]
Schaaf, P. [2 ]
Jacobs, H. O. [1 ]
Pezoldt, J. [1 ]
机构
[1] TU Ilmenau, FG Nanotechnol, Inst Mikro & Nanotechnol MacroNano, Inst Mikro & Nanoelekt,Inst Werkstofftech, D-98684 Ilmenau, Germany
[2] TU Ilmenau, FG Werkstoffe Elektrotech, Inst Werkstofftech, Inst Mikro & Nanotechnol MacroNano, Gustav Kirchhoff Str 5, D-98693 Ilmenau, Germany
[3] Tech Univ Ilmenau, Inst Phys, Inst Mikro & Nanotechnol MacroNano, FG Tech Phys 1, D-98684 Ilmenau, Germany
关键词
D O I
10.1063/5.0165868
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Hysteresis effects and their tuning with electric fields and light were studied in thin film molybdenum disulfide transistors fabricated from sulfurized molybdenum films. The influence of the back-gate voltage bias, voltage sweep range, illumination, and AlOx encapsulation on the hysteresis effect of the back-gated field effect transistors was studied and quantified. This study revealed the distinctive contribution of MoS2 surface, MoS2/SiO2 interface defects and their associated traps as primary sources of of hysteresis. (c) 2023 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
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页数:7
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