Monitoring of Location Parameters with a Measurement Error under the Bayesian Approach Using Ranked-Based Sampling Designs with Applications in Industrial Engineering

To detect sustainable changes in the production processes, memory-type control charts are frequently utilized. This study is conducted to assess the performance of the Bayesian adaptive exponentially weighted moving average (AEWMA) control chart using ranked set sampling schemes following two different loss functions in the presence of a measurement error for posterior and posterior predictive distributions using conjugate priors. This study is based on the covariate model and multiple measurement methods in the presence of a measurement error (ME). The performance of the proposed Bayesian-AEWMA control chart with ME has been evaluated through the average run length and the standard deviation of the run length. Finally, a real-life application in semiconductor manufacturing was conducted to evaluate the effectiveness of the proposed Bayesian-AEWMA control chart with a measurement error based on different ranked set sampling schemes. The results demonstrate that the proposed control chart, in the presence of a measurement error, performed well in detecting out-of-control signals compared to the existing control chart. However, the median ranked set sampling scheme (MRSS) proved to be better than the other two schemes in the presence of a measurement error.