Jump and Pull-in Instability of a MEMS Gyroscope Vibrating System

被引:0
|
作者
Zhu, Yijun [1 ]
Shang, Huilin [1 ]
机构
[1] Shanghai Inst Technol, Sch Mech Engn, Shanghai 201418, Peoples R China
基金
中国国家自然科学基金;
关键词
MEMS gyroscope; bistability; jump; pull-in instability; saddle-node bifurcation; heteroclinic bifurcation; fractal; PARAMETRIC RESONANCE; STABILITY;
D O I
10.3390/mi14071396
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Jump and pull-in instability are common nonlinear dynamic behaviors leading to the loss of the performance reliability and structural safety of electrostatic micro gyroscopes. To achieve a better understanding of these initial-sensitive phenomena, the dynamics of a micro gyroscope system considering the nonlinearities of the stiffness and electrostatic forces are explored from a global perspective. Static and dynamic analyses of the system are performed to estimate the threshold of the detecting voltage for static pull-in, and dynamic responses are analyzed in the driving and detecting modes for the case of primary resonance and 1:1 internal resonance. The results show that, when the driving voltage frequency is a bit higher than the natural frequency, a high amplitude of the driving AC voltage may induce the coexistence of bistable periodic responses due to saddle-node bifurcation of the periodic solution. Basins of attraction of bistable attractors provide evidence that disturbance of the initial conditions can trigger a jump between bistable attractors. Moreover, the Melnikov method is applied to discuss the condition for pull-in instability, which can be ascribed to heteroclinic bifurcation. The validity of the prediction is verified using the sequences of safe basins and unsafe zones for dynamic pull-in. It follows that pull-in instability can be caused and aggravated by the increase in the amplitude of the driving AC voltage.
引用
收藏
页数:20
相关论文
共 50 条
  • [1] A novel dynamic pull-in MEMS gyroscope
    Sharma, Mrigank
    Sarraf, Elie H.
    Cretu, Edmond
    [J]. EUROSENSORS XXV, 2011, 25
  • [2] FRACTAL N/MEMS: FROM PULL-IN INSTABILITY TO PULL-IN STABILITY
    Tian, Dan
    Ain, Qura-Tul
    Anjum, Naveed
    He, Chun-Hui
    Cheng, Bin
    [J]. FRACTALS-COMPLEX GEOMETRY PATTERNS AND SCALING IN NATURE AND SOCIETY, 2021, 29 (02)
  • [3] Pull-In Instability and Vibrations of a Beam Micro-Gyroscope
    Zand, Mahdi Moghimi
    Moghaddam, Amir Ostadi
    [J]. JOURNAL OF COMPUTATIONAL APPLIED MECHANICS, 2014, 45 (01): : 29 - 34
  • [4] Electrostatic pull-in instability in MEMS/NEMS: A review
    Zhang, Wen-Ming
    Yan, Han
    Peng, Zhi-Ke
    Meng, Guang
    [J]. SENSORS AND ACTUATORS A-PHYSICAL, 2014, 214 : 187 - 218
  • [5] PULL-IN STABILITY OF A FRACTAL MEMS SYSTEM AND ITS PULL-IN PLATEAU
    He, Ji-Huan
    Yang, Qian
    He, Chun-Hui
    Li, Hai-Bin
    Buhe, Eerdun
    [J]. FRACTALS-COMPLEX GEOMETRY PATTERNS AND SCALING IN NATURE AND SOCIETY, 2022, 30 (09)
  • [6] STUDIES ON PULL-IN INSTABILITY OF AN ELECTROSTATIC MEMS ACTUATOR: DYNAMICAL SYSTEM APPROACH
    Liu, Xiangshuo
    Zhang, Lijun
    Zhang, Mingji
    [J]. JOURNAL OF APPLIED ANALYSIS AND COMPUTATION, 2022, 12 (02): : 850 - 861
  • [7] Jump and pull-in dynamics of an electrically actuated bistable MEMS device
    Ruzziconi, Laura
    Lenci, Stefano
    Younis, Mohammad I.
    [J]. CSNDD 2014 - INTERNATIONAL CONFERENCE ON STRUCTURAL NONLINEAR DYNAMICS AND DIAGNOSIS, 2014, 16
  • [8] Theoretical Prediction of Experimental Jump and Pull-In Dynamics in a MEMS Sensor
    Ruzziconi, Laura
    Ramini, Abdallah H.
    Younis, Mohammad I.
    Lenci, Stefano
    [J]. SENSORS, 2014, 14 (09): : 17089 - 17111
  • [9] Design of RF MEMS Switches without Pull-in Instability
    Proctor, W. Cyrus
    Richards, Gregory P.
    Shen, Chongyi
    Skorczewski, Tyler
    Wang, Min
    Zhang, Jingyan
    Zhong, Peng
    Massad, Jordan E.
    Smith, Ralph
    [J]. BEHAVIOR AND MECHANICS OF MULTIFUNCTIONAL MATERIALS AND COMPOSITES 2010, 2010, 7644
  • [10] Pull-in MEMS Inclinometer
    Alves, F. S.
    Dias, R. A.
    Cabral, J.
    Rocha, L. A.
    [J]. 26TH EUROPEAN CONFERENCE ON SOLID-STATE TRANSDUCERS, EUROSENSOR 2012, 2012, 47 : 1239 - 1242